Test Interface Solution (TIS)

TIS, founded in 2014, is a high-end semiconductor test interface solutions provider based in China with a global outlook. The company is dedicated to improving chip testing efficiency and accelerating time-to-market for its clients.

Support for ATE Platforms
• Advtantest (V93K, EXA)
• Teradyne(UltraFlex, UltraFlex Plus. J750, Magnum)
• Xerra (D10, DX)
• Chroma (3680. 3650. 3380x)

Return

Product DescriptionProduct ParametersApplication Field

Test Interface Business

• Loadboard

 Vertical Probe Card(MB + MLO/MLC + Probe Head)

 Cantilever Probe Card(PC + Probe Head)

 WLCSP Probe Card Business(LB + WLCSP Socket)

 BIB(HTOL/HAST/EMI)

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